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Channel: Emerald Group Publishing Limited: Microelectronics International: An International Journal: Table of Contents
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Printed electronics 2012 Berlin, Germany 3-4 April 2012

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IeMRC plastic and printed electronics

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Synopsys, Altera and TSMC collaborate to deliver Silicon-accurate parasitic...

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Camtek receives orders in excess of $3.5 Million for its backend...

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Renesas Electronics honoured with Siemens Supplier Award in the “Special...

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TSMC expands investment in Taiwan with new milestone for Taichung GigaFab

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Thinfilm Wins IDTechEx Product Development Award for World’s First Printed...

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International diary

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Altera and TSMC jointly develop world’s first heterogeneous 3-D IC test...

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Latest Synplify FPGA synthesis software offers new high reliability features...

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Camtek launches Phoenix: its next generation AOI system for the PCB and IC...

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Fairchild Semiconductor and Infineon Technologies expand compatibility...

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Renesas Electronics introduces new V850 microcontroller (MCU) series with...

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Multitest leverages MT9510×16 for quad-site MEMS applications

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Cadence delivers high-performance, low-power design IP supporting LPDDR3...

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Viscom develops an innovative 3-D MID inspection system

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Analysis of warpage and residual stress in plastic ball grid array package...

AbstractPurpose – The purpose of this paper is to provide a design and material selection guideline for a plastic ball grid array (PBGA) package in order to improve its reliability and manufacturing...

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A dual-band voltage-controlled oscillator in 0.13?µm CMOS technology

AbstractPurpose – The purpose of this paper is to design and implement a fully integrated low-phase noise and large tuning range dual-band LC voltage-controlled oscillator (VCO) in 0.13?µm...

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Finite element modeling of channel sag in LTCC

AbstractPurpose – In microfluidic channel fabrication in low temperature co-fired ceramics (LTCC), one of the biggest challenges is the elimination of channel deformation during lamination. The purpose...

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A new time-dependent mobility degradation model for MOS transistors

AbstractPurpose – The purpose of this paper is to propose a time-dependent mobility degradation model which is independent from the process or operating conditions. Design/methodology/approach – In...

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